著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Inoue Satoshi and Ohshima Hiroyuki and Shimoda Tatsuya,Analysis of Degradation Phenomenon Caused by Self-Heating in Low-Temperature-Processed Polycrystalline Silicon Thin Film Transistors.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2002,41,11A,6313-6319,https://cir.nii.ac.jp/crid/1390001206254843008,https://doi.org/10.1143/jjap.41.6313