著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kim Young-Bae and Choi Duck-Kyun,"Auger Electron Spectroscopy Study on the Tolerance to Forming Gas Anneal of (Ba, Sr)TiO<sub>3</sub>with SiO<sub>2</sub>capped (Ba, Sr)RuO<sub>3</sub>Electrode",Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2003,42,5A,2633-2638,https://cir.nii.ac.jp/crid/1390001206255165696,https://doi.org/10.1143/jjap.42.2633