著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kitahara Kuninori and Ohnishi Kazuma and Katoh Yoshihiro and Yamazaki Ryosuke and Kurosawa Toshitaka,Analysis of Defects in Polycrystalline Silicon Thin Films Using Raman Scattering Spectroscopy,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2003,42,11,6742-6747,https://cir.nii.ac.jp/crid/1390001206264516480,https://doi.org/10.1143/jjap.42.6742