Measurement and Analysis of Cavity Loss of a 266 nm Continuous-Wave Solid-State Laser
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- Wada Hiroyuki
- SONY Co.
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- Oka Michio
- SONY Co.
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- Tatsuki Koichi
- SONY Co.
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- Saito Masaki
- SONY Co.
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- Kubota Shigeo
- SONY Co.
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説明
The effect of purge air on the reliability of a 266 nm continuous-wave (cw) solid-state laser was analyzed by measuring the cavity loss of an ultraviolet (UV) laser. The water content of the purge air strongly connected with the reliability of the laser. Irradiation by UV laser beam and existence of water around a mirror in an external cavity created scatterers on the surface of the mirror. The scatterers increased the cavity loss of the UV laser and markedly decreased the UV laser power.
収録刊行物
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- Japanese Journal of Applied Physics
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Japanese Journal of Applied Physics 43 (3B), L393-L395, 2004
The Japan Society of Applied Physics
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詳細情報 詳細情報について
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- CRID
- 1390001206264919040
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- NII論文ID
- 210000057187
- 10012705079
- 130004531780
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- NII書誌ID
- AA10650595
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- ISSN
- 13474065
- 00214922
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- NDL書誌ID
- 6887436
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- NDLサーチ
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可