著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Choongpyo Jeon,A New Method of Component-Level ESD Test to Assess System-Level ESD Risk for Ics,IEICE Proceeding Series,2188-5079,"The Institute of Electronics, Information and Communication Engineers",2016-10-05,58,,ThuPM2D.2,https://cir.nii.ac.jp/crid/1390003825197270016,https://doi.org/10.34385/proc.58.thupm2d.2