Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Furuta Satomu and Horita Masahiro and Tanaka Nariaki and Oka Tohru and Suda Jun,Depth profiling of deep-level traps in GaN introduced by high-temperature thermal treatment with SiN cap layer,JSAP Annual Meetings Extended Abstracts,2436-7613,The Japan Society of Applied Physics,2020-02-28,2020.1,0,2826-2826,https://cir.nii.ac.jp/crid/1390010765198691200,https://doi.org/10.11470/jsapmeeting.2020.1.0_2826