Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Sasaki Takuo and Takahasi Masamitu,Distribution Measurements of Dislocations in Compound Semiconductors by Synchrotron Microbeam X-ray Diffraction,SPring-8/SACLA Research Report,2187-6886,Japan Synchrotron Radiation Research Institute,2024-02-29,12,1,4-7,https://cir.nii.ac.jp/crid/1390017843875567872,https://doi.org/10.18957/rr.12.1.4