Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Nakamura Yuki and Horikawa Tai,AI Method of Abnormal Detection for Electrical Components and Implement Ability for Edge Device,Journal of The Japan Institute of Electronics Packaging,1343-9677,The Japan Institute of Electronics Packaging,2024-05-01,27,3,226-231,https://cir.nii.ac.jp/crid/1390018518956120960,https://doi.org/10.5104/jiep.27.226