著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Yin Minghui and Li Zhiqiang and Zhang Weihua and Liu Hongwei and Zhou Huanhuan and You Yunxia and Wang Chen,"Power, performance, and area evaluation across 180nm-28nm technology nodes based on benchmark circuits",IEICE Electronics Express,1349-2543,一般社団法人 電子情報通信学会,2024-05-10,21,9,20240194-20240194,https://cir.nii.ac.jp/crid/1390018616996133376,https://doi.org/10.1587/elex.21.20240194