The background of X-ray fluorescence (XRF) spectra of a lead-containing resin measured at 3 milliwatts of X-ray tube input are (i) experimentally removed by a three-dimensional polarized zirconium secondary target experiment and (ii) numerically removed by the Akima interpolation calculations. Two methods are compared. Both methods were shown to effectively reduce the background. The XRF spectra with low background obtained by the two methods are different based on their principles, as well as the target elements. Polarization optics showed that XRF spectra of good S/N can be obtained even with an X-ray tube input of 15 milliwatts. We propose a new discrimination method of overlapping peaks by iterative calculation for Akima interpolation.
"},{"@language":"ja","@value":"3ミリワットのX線管入力電力で測定した鉛含有樹脂の蛍光X線スペクトルのバックグラウンドを，偏光光学ジルコニウム2次ターゲットによって実験的に除去する方法と，秋間補間法によって数値的に除去する方法との2つの方式を試みた．どちらの方法もバックグラウンドを効率的に低減させることを示した．2つの方法で得られたバックグラウンドの低い蛍光X線スペクトルは，それぞれの原理とターゲット元素の違いに基づいて，異なる蛍光X線スペクトルとなった．偏光光学では，15ミリワットのX線管入力でも十分なS/Nの蛍光X線が測定できることを示した．秋間補間では，繰返し計算によるピークの重なりの新しい判別方法を提案した．
"}],"abstractLicenseFlag":"allow"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1410023107066000002","@type":"Researcher","foaf:name":[{"@language":"ja","@value":"加藤 駿英"},{"@language":"en","@value":"KATO Toshihide"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Department of Materials Science and Engineering, Kyoto University"},{"@language":"ja","@value":"京都大学大学院工学研究科材料工学専攻"}]},{"@id":"https://cir.nii.ac.jp/crid/1410023107066000001","@type":"Researcher","foaf:name":[{"@language":"ja","@value":"大橋 律禅"},{"@language":"en","@value":"OHASHI Rizen"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Department of Materials Science and Engineering, Kyoto University"},{"@language":"ja","@value":"京都大学大学院工学研究科材料工学専攻"}]},{"@id":"https://cir.nii.ac.jp/crid/1410023107066000000","@type":"Researcher","foaf:name":[{"@language":"ja","@value":"向山 毅"},{"@language":"en","@value":"MUKOYAMA Takeshi"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Institute for Chemical Research, Kyoto University"},{"@language":"ja","@value":"京都大学化学研究所"}]},{"@id":"https://cir.nii.ac.jp/crid/1410023107066000003","@type":"Researcher","foaf:name":[{"@language":"ja","@value":"河合 潤"},{"@language":"en","@value":"KAWAI Jun"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Department of Materials Science and Engineering, Kyoto University"},{"@language":"ja","@value":"京都大学大学院工学研究科材料工学専攻"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"09117806"},{"@type":"EISSN","@value":"27583651"},{"@type":"NDL_BIB_ID","@value":"000000048610"},{"@type":"ISSN","@value":"09117806"},{"@type":"LISSN","@value":"09117806"},{"@type":"NCID","@value":"AN0000592X"}],"prism:publicationName":[{"@language":"ja","@value":"Ｘ線分析の進歩"},{"@language":"en","@value":"Advances in X-Ray Chemical Analysis, Japan"},{"@language":"en","@value":"Adv. X-Ray Chem. Anal. Jpn."}],"dc:publisher":[{"@language":"en","@value":"The Discussion Group of X-Ray Analysis, The Japan Society for Analytical Chemistry"},{"@language":"ja","@value":"公益社団法人 日本分析化学会 X線分析研究懇談会"}],"prism:publicationDate":"2023-03-31","prism:volume":"54","prism:number":"0","prism:startingPage":"39","prism:endingPage":"46"},"url":[{"@id":"http://id.ndl.go.jp/bib/032790927"},{"@id":"https://ndlsearch.ndl.go.jp/books/R000000004-I032790927"}],"availableAt":"2023-03-31","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=Background%20reduction","dc:title":"Background reduction"},{"@id":"https://cir.nii.ac.jp/all?q=Ultra-low%20power%20X-ray%20analysis","dc:title":"Ultra-low power X-ray analysis"},{"@id":"https://cir.nii.ac.jp/all?q=Milliwatts","dc:title":"Milliwatts"},{"@id":"https://cir.nii.ac.jp/all?q=Polarized%20secondary%20target","dc:title":"Polarized secondary target"},{"@id":"https://cir.nii.ac.jp/all?q=Akima%20interpolation","dc:title":"Akima interpolation"},{"@id":"https://cir.nii.ac.jp/all?q=%E3%83%90%E3%83%83%E3%82%AF%E3%82%B0%E3%83%A9%E3%82%A6%E3%83%B3%E3%83%89%E4%BD%8E%E6%B8%9B","dc:title":"バックグラウンド低減"},{"@id":"https://cir.nii.ac.jp/all?q=%E8%B6%85%E4%BD%8E%E9%9B%BB%E5%8A%9BX%E7%B7%9A%E5%88%86%E6%9E%90","dc:title":"超低電力X線分析"},{"@id":"https://cir.nii.ac.jp/all?q=%E3%83%9F%E3%83%AA%E3%83%AF%E3%83%83%E3%83%88","dc:title":"ミリワット"},{"@id":"https://cir.nii.ac.jp/all?q=%E5%81%8F%E5%85%892%E6%AC%A1%E3%82%BF%E3%83%BC%E3%82%B2%E3%83%83%E3%83%88","dc:title":"偏光2次ターゲット"},{"@id":"https://cir.nii.ac.jp/all?q=%E7%A7%8B%E9%96%93%E8%A3%9C%E9%96%93","dc:title":"秋間補間"}],"dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:2014112698"},{"@type":"NDL_SEARCH","@value":"oai:ndlsearch.ndl.go.jp:R000000004-I032790927"}]}