Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
KIKUCHI Michimasa and INOUE Naohisa and TANAHASI Katsuto,The Effect of Stress due to Impurity on Point Defect Generation in Silicon Crystal.,Shinku,05598516,The Vacuum Society of Japan,1999,42,3,349-352,https://cir.nii.ac.jp/crid/1390282679042106112,https://doi.org/10.3131/jvsj.42.349