{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1390282679162273408.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1143/jpsj.56.163"}},{"identifier":{"@type":"COI","@value":"1:CAS:528:DyaL2sXhsVOku7s%3D"}},{"identifier":{"@type":"BIBCODE","@value":"1987JPSJ...56..163T"}},{"identifier":{"@type":"NDL_BIB_ID","@value":"3114420"}},{"identifier":{"@type":"URI","@value":"http://id.ndl.go.jp/bib/3114420"}},{"identifier":{"@type":"URI","@value":"https://ndlsearch.ndl.go.jp/books/R000000004-I3114420"}},{"identifier":{"@type":"URI","@value":"http://journals.jps.jp/doi/pdf/10.1143/JPSJ.56.163"}},{"identifier":{"@type":"NAID","@value":"210000093308"}},{"identifier":{"@type":"NAID","@value":"110001960130"}},{"identifier":{"@type":"NAID","@value":"130003899229"}}],"dc:title":[{"@language":"en","@value":"Elastic and Dielectric Properties of LiNbO<SUB>3</SUB>"},{"@value":"Elastic and Dielectric Properties of LiNbO3"},{"@language":"ja-Kana","@value":"Elastic and Dielectric Properties of Li"}],"dc:language":"en","description":[{"type":"abstract","notation":[{"@language":"en","@value":"Elastic constants <I>C</I><SUB>11</SUB>, <I>C</I><SUB>33</SUB>, <I>C</I><SUB>44</SUB>, and <I>C</I><SUB>66</SUB>, and dielectric susceptibilities χ<SUB>11</SUB> and χ<SUB>33</SUB> in LiNbO<SUB>3</SUB>, were determined over the temperature range from 300 to above 1030 K. The elastic-constant difference between constant polarization and constant field <I>C</I><SUB>ii</SUB><I><SUP>P</SUP></I>−<I>C</I><SUB>i<I>i</I></SUB><I><SUP>E</SUP></I>, and the inverse-susceptibility difference between constant strain and constant stress (χ<SUB><I>i</I>i</SUB><I><SUP>x</SUP></I>)<SUP>−1</SUP>−(χ<SUB>ii</SUB><I><SUP>X</SUP></I>)<SUP>−1</SUP> are interpreted in terms of both electrostrictive and higher-order interaction between strain and polarization. The results for χ<SUB>33</SUB> indicate that LiNbO<SUB>3</SUB> undergoes nearly second-order phase transition at <I>T<SUB>C</SUB></I>=1410 K. Above <I>T<SUB>C</SUB></I>, χ<SUB>33</SUB> showed dispersion in the frequency range between 1 and 13 MHz. A comparison of these results with soft-mode frequency implies that the soft mode couples with a low frequency relaxation process near <I>T<SUB>C</SUB></I>."}],"abstractLicenseFlag":"disallow"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1410001204181537666","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000254133112"},{"@type":"NRID","@value":"9000252950560"},{"@type":"NRID","@value":"9000258195560"},{"@type":"NRID","@value":"9000003264604"},{"@type":"NRID","@value":"9000401870793"},{"@type":"NRID","@value":"9000258186813"},{"@type":"NRID","@value":"9000003202917"},{"@type":"NRID","@value":"9000254554944"},{"@type":"NRID","@value":"9000401885806"},{"@type":"NRID","@value":"9000392685650"},{"@type":"NRID","@value":"9000401588303"},{"@type":"NRID","@value":"9000254133631"},{"@type":"NRID","@value":"9000003416204"},{"@type":"NRID","@value":"9000401848109"},{"@type":"NRID","@value":"9000254562807"},{"@type":"NRID","@value":"9000401849180"},{"@type":"NRID","@value":"9000401842901"},{"@type":"NRID","@value":"9000401856240"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/read0198279"}],"foaf:name":[{"@language":"en","@value":"Tomeno Izumi"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Toshiba Research and Development Center, Toshiba Corporation"}]},{"@id":"https://cir.nii.ac.jp/crid/1410282679162273409","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000003277749"},{"@type":"NRID","@value":"9000254562808"},{"@type":"NRID","@value":"9000401856241"}],"foaf:name":[{"@language":"en","@value":"Matsumura Sadao"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Electron Tube and Device Division, Toshiba Corporation"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00319015"},{"@type":"LISSN","@value":"00319015"},{"@type":"EISSN","@value":"13474073"},{"@type":"NDL_BIB_ID","@value":"000000118709"},{"@type":"ISSN","@value":"00319015"},{"@type":"NCID","@value":"AA00704814"}],"prism:publicationName":[{"@language":"en","@value":"Journal of the Physical Society of Japan"},{"@language":"ja","@value":"Ｊｏｕｒｎａｌ　ｏｆ　ｔｈｅ　Ｐｈｙｓｉｃａｌ　Ｓｏｃｉｅｔｙ　ｏｆ　Ｊａｐａｎ"},{"@language":"en","@value":"JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN"},{"@language":"en","@value":"JPSJ"},{"@language":"ja","@value":"ＪＰＳＪ"}],"dc:publisher":[{"@language":"en","@value":"THE PHYSICAL SOCIETY OF JAPAN"},{"@language":"ja","@value":"一般社団法人 日本物理学会"}],"prism:publicationDate":"1987","prism:volume":"56","prism:number":"1","prism:startingPage":"163","prism:endingPage":"177"},"reviewed":"false","url":[{"@id":"http://id.ndl.go.jp/bib/3114420"},{"@id":"https://ndlsearch.ndl.go.jp/books/R000000004-I3114420"},{"@id":"http://journals.jps.jp/doi/pdf/10.1143/JPSJ.56.163"}],"availableAt":"1987","relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360011143762032512","@type":"Article","relationType":["references"],"jpcoar:relatedTitle":[{"@value":"Crystal growth and fundamental properties of 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