著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Shin Woosuck and Ishikawa Masahiko and Nishibori Maiko and Izu Noriya and Itoh Toshio and Matsubara Ichiro,High-Temperature Thermoelectric Measurement of B-Doped SiGe and Si Thin Films,MATERIALS TRANSACTIONS,13459678,公益社団法人 日本金属学会,2009,50,7,1596-1602,https://cir.nii.ac.jp/crid/1390282679226429440,https://doi.org/10.2320/matertrans.e-m2009811