著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
HIGO Morihide and KAMATA Satsuo,Characterization of Metal Oxide Surfaces and Thin Semiconductor Films by Inelastic Electron Tunneling Spectroscopy.,Analytical Sciences,09106340,社団法人 日本分析化学会,2002,18,3,227-242,https://cir.nii.ac.jp/crid/1390282679233800448,https://doi.org/10.2116/analsci.18.227