著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Widiant and HASHIZUME Masaki and SUENAGA Shohei and YOTSUYANAGI Hiroyuki and ONO Akira and LU Shyue-Kung and ROTH Zvi,A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs,IEICE Transactions on Information and Systems,0916-8532,一般社団法人 電子情報通信学会,2016,E99.D,11,2723-2733,https://cir.nii.ac.jp/crid/1390282679355793792,https://doi.org/10.1587/transinf.2015edp7273