{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1390282679429447296.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.11348/reajshinrai.36.3_174"}},{"identifier":{"@type":"NDL_BIB_ID","@value":"025569907"}},{"identifier":{"@type":"URI","@value":"http://id.ndl.go.jp/bib/025569907"}},{"identifier":{"@type":"URI","@value":"https://ndlsearch.ndl.go.jp/books/R000000004-I025569907"}},{"identifier":{"@type":"NAID","@value":"110009818805"}}],"dc:title":[{"@language":"ja","@value":"製品・システムの保全性保証(<特集>製品・システムの保全性)"},{"@language":"en","@value":"Maintainability Assurance for Products and Systems(<Special Survey>Maintainability of Products and Systems)"},{"@value":"製品・システムの保全性保証"},{"@language":"ja-Kana","@value":"セイヒン ・ システム ノ ホゼンセイ ホショウ"}],"dc:language":"ja","description":[{"type":"abstract","notation":[{"@language":"ja","@value":"様々なシステムが開発と運用を明確に分けられることなく,絶え間なく運用されるようになった.例えばスマートフォンは,常にソフトウエアが更新され日々新しくなっている.これからのシステム保全は,運用の一部分としてではなく,システムのライフサイクル全体で行う必要がある.本稿ではシステム保証の新しい手法であり,筆者が最近研究を行っているアシュアランスケースを説明する.次にシステムライフサイクル全体におけるシステム保全性保証の例として,電気通信大学(以下,電通大)などが提案しているOMG Dependability Assurance Framework for Safety-Sensitive Consumer Devices(SSCD)国際規格について説明する.SSCDは日本のすり合わせ開発をモデル化したプロセスモデル,システムのディペンダビリティに関連する用語モデル,そしてシステムのディペンダビリティを保証するためのアシュアランスケーステンプレートよりなり,日本発のシステムのディペンダビリティ保証の枠組みとしてIPA(独立行政法人情報処理推進機構)を中心に策定中である.SSCDを元に,保守の観点から,システムライフサイクル全般のディペンダビリティ保証について考察する."}],"abstractLicenseFlag":"disallow"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1420282801198243840","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"50340766"},{"@type":"NRID","@value":"1000050340766"},{"@type":"NRID","@value":"9000005825874"},{"@type":"NRID","@value":"9000406019129"},{"@type":"NRID","@value":"9000018714492"},{"@type":"NRID","@value":"9000405476727"},{"@type":"NRID","@value":"9000283545589"},{"@type":"NRID","@value":"9000256485347"},{"@type":"NRID","@value":"9000398041407"},{"@type":"NRID","@value":"9000018714602"},{"@type":"NRID","@value":"9000318575700"},{"@type":"NRID","@value":"9000018714593"},{"@type":"NRID","@value":"9000290816929"},{"@type":"NRID","@value":"9000259302987"},{"@type":"NRID","@value":"9000313191514"},{"@type":"NRID","@value":"9000045430943"},{"@type":"NRID","@value":"9000261699112"},{"@type":"NRID","@value":"9000018714536"},{"@type":"NRID","@value":"9000404336860"},{"@type":"NRID","@value":"9000304696012"},{"@type":"NRID","@value":"9000290816928"},{"@type":"NRID","@value":"9000405463923"},{"@type":"NRID","@value":"9000411484005"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/matsuno-yutaka"}],"foaf:name":[{"@language":"ja","@value":"松野 裕"},{"@language":"en","@value":"MATSUNO Yutaka"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"電気通信大学"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"09192697"},{"@type":"LISSN","@value":"09192697"},{"@type":"EISSN","@value":"24242543"},{"@type":"NDL_BIB_ID","@value":"000000086236"},{"@type":"ISSN","@value":"09192697"},{"@type":"NCID","@value":"AN10540883"}],"prism:publicationName":[{"@language":"ja","@value":"日本信頼性学会誌　信頼性"},{"@language":"en","@value":"The Journal of Reliability Engineering Association of Japan"}],"dc:publisher":[{"@language":"en","@value":"Reliability Engineering Association of Japan"},{"@language":"ja","@value":"日本信頼性学会"}],"prism:publicationDate":"2014","prism:volume":"36","prism:number":"3","prism:startingPage":"174","prism:endingPage":"179"},"url":[{"@id":"http://id.ndl.go.jp/bib/025569907"},{"@id":"https://ndlsearch.ndl.go.jp/books/R000000004-I025569907"}],"availableAt":"2014","dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:2003613795"},{"@type":"NDL_SEARCH","@value":"oai:ndlsearch.ndl.go.jp:R000000004-I025569907"},{"@type":"CIA","@value":"110009818805"}]}