Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
OBINATA Koji,"The Latest Trend of the NBTI Degradation Model(CMOS Technology-Limit, Challenge and New Development)",The Journal of Reliability Engineering Association of Japan,09192697,Reliability Engineering Association of Japan,2011,33,4,164-169,https://cir.nii.ac.jp/crid/1390282679429689728,https://doi.org/10.11348/reajshinrai.33.4_164