Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
OHTA Masahiro and UEYAMA Hitoshi and SUGAWARA Yasuhiro and MORITA Seizo,Atomic resolution image of cleaved surface of compound semiconductors observed with ultrahigh-vacuum atomic force microscope in contact and noncontact modes,Oyo Buturi,0369-8009,The Japan Society of Applied Physics,1995,64,6,583-587,https://cir.nii.ac.jp/crid/1390282679573902080,https://doi.org/10.11470/oubutsu1932.64.583