Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Nakane Hideaki and Adachi Hiroshi,Review of Scanning Probe Microscope,IEEJ Transactions on Fundamentals and Materials,03854205,The Institute of Electrical Engineers of Japan,1996,116,4,293-296,https://cir.nii.ac.jp/crid/1390282679576660352,https://doi.org/10.1541/ieejfms1990.116.4_293