Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Nakagawa Yoshihiro and Oda Tadaaki and Kurihara Masahito and Ohuchi Azuma,Package-level Fault Diagnosis of Sequential Circuits Based on Automated Reasoning,"IEEJ Transactions on Electronics, Information and Systems",03854221,The Institute of Electrical Engineers of Japan,1990,110,8,500-507,https://cir.nii.ac.jp/crid/1390282679584161664,https://doi.org/10.1541/ieejeiss1987.110.8_500