Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Kurokawa Atsushi and Hoshi Makoto and Watanabe Masayuki,Impact of Device Degradation Due to NBTI on Gated Clock Systems,"IEEJ Transactions on Electronics, Information and Systems",03854221,The Institute of Electrical Engineers of Japan,2014,134,3,355-361,https://cir.nii.ac.jp/crid/1390282679585283584,https://doi.org/10.1541/ieejeiss.134.355