{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1390282679774584320.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.2493/jjspe.53.1158"}},{"identifier":{"@type":"NDL_BIB_ID","@value":"3138742"}},{"identifier":{"@type":"URI","@value":"http://id.ndl.go.jp/bib/3138742"}},{"identifier":{"@type":"URI","@value":"https://ndlsearch.ndl.go.jp/books/R000000004-I3138742"}},{"identifier":{"@type":"NAID","@value":"110001369261"}}],"dc:title":[{"@language":"en","@value":"Surface testing for electronic industry."},{"@value":"エレクトロニクス産業関連の欠陥検査"},{"@language":"ja-Kana","@value":"エレクトロニクス サンギョウ カンレン ノ ケッカン ケンサ"}],"dc:language":"ja","description":[{"type":"abstract","notation":[{"@value":"表面欠陥検査はまだ人手に頼る場合が多い.しかしエレクトロニクス産業における欠陥検査のように,広い面積の中の微小欠陥検出においては,肉眼作業の疲労の問題から,レーザを用いた方法が使われ始めている.<BR>ここでは,パターンのある表面の検査に的を絞り,各種方法を紹介した.ハイテク産業の発展とともに,今後ますます欠陥検出感度向上の必要性が高まるものと思われる."}],"abstractLicenseFlag":"disallow"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1410282679774584320","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000020754041"}],"foaf:name":[{"@language":"en","@value":"ONO Akira"},{"@language":"ja","@value":"小野 明"}],"jpcoar:affiliationName":[{"@language":"ja","@value":"正会員 (株)東芝"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"09120289"},{"@type":"LISSN","@value":"09120289"},{"@type":"EISSN","@value":"1882675X"},{"@type":"NDL_BIB_ID","@value":"000000043699"},{"@type":"ISSN","@value":"09120289"},{"@type":"NCID","@value":"AN1003250X"}],"prism:publicationName":[{"@language":"en","@value":"Journal of the Japan Society for Precision Engineering"},{"@language":"ja","@value":"精密工学会誌"},{"@language":"en","@value":"Journal of the Japan Society for Precision Engineering"},{"@language":"ja","@value":"精密工学会誌"}],"dc:publisher":[{"@language":"en","@value":"The Japan Society for Precision Engineering"},{"@language":"ja","@value":"公益社団法人 精密工学会"}],"prism:publicationDate":"1987","prism:volume":"53","prism:number":"8","prism:startingPage":"1158","prism:endingPage":"1160"},"reviewed":"false","url":[{"@id":"http://id.ndl.go.jp/bib/3138742"},{"@id":"https://ndlsearch.ndl.go.jp/books/R000000004-I3138742"}],"availableAt":"1987","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=testing","dc:title":"testing"},{"@id":"https://cir.nii.ac.jp/all?q=electronic%20industry","dc:title":"electronic industry"},{"@id":"https://cir.nii.ac.jp/all?q=defect","dc:title":"defect"},{"@id":"https://cir.nii.ac.jp/all?q=surface","dc:title":"surface"},{"@id":"https://cir.nii.ac.jp/all?q=pattern","dc:title":"pattern"},{"@id":"https://cir.nii.ac.jp/all?q=optics","dc:title":"optics"},{"@id":"https://cir.nii.ac.jp/all?q=image%20processing","dc:title":"image processing"}],"relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1390282681305480192","@type":"Article","relationType":["isCitedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Detection of Scratches on the Hairline Finished Surfaces Using Image Processing Method."},{"@value":"画像処理によるヘアライン仕上面の欠陥検出方法"},{"@language":"ja-Kana","@value":"ガゾウ ショリ ニ ヨル ヘアライン シアゲメン ノ ケッカン ケンシュツ ホウホウ"}]}],"dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:0021718562"},{"@type":"NDL_SEARCH","@value":"oai:ndlsearch.ndl.go.jp:R000000004-I3138742"},{"@type":"CROSSREF","@value":"10.2493/jjspe.53.1158"},{"@type":"CIA","@value":"110001369261"}]}