Optimization of periphery circuits in a 1K-bit PCRAM chip for highly reliable write and read operations
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- Wang Qian
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Chen Houpeng
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Li Xi
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Zhang Yiyun
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Fan Xi
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Song Zhitang
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Chen Yifeng
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Jin Rong
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
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- Hu Jiajun
- State Key Laboratory of Functional Materials for Informatics, Shanghai Key Laboratory of Nanofabrication Technology for Memory, Shanghai Institute of Micro-system and Information Technology, Chinese Academy of Sciences
書誌事項
- 公開日
- 2014
- DOI
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- 10.1587/elex.11.20141071
- 公開者
- 一般社団法人 電子情報通信学会
この論文をさがす
説明
A 1K-bit phase change random access memory (PCRAM) with improved periphery circuits for better reliable operations has been successfully developed in 130 nm CMOS technology. A flexible write driver is proposed to provide a novel continuous step-down pulses by studying programming strategies while a reliable read circuit is designed by investigating the special transition characteristics of PCRAM, leading to an effective write operation and a non-destructive read operation without any additional changes of the storage states. In addition, a large sense margin has been achieved and the read results corresponding well with the write operations, which demonstrate the influences of technology variations have been considerably decreased with the proposed periphery circuits.
収録刊行物
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- IEICE Electronics Express
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IEICE Electronics Express 11 (24), 20141071-20141071, 2014
一般社団法人 電子情報通信学会
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詳細情報 詳細情報について
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- CRID
- 1390282680189102464
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- NII論文ID
- 130004713146
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- ISSN
- 13492543
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- 本文言語コード
- en
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- データソース種別
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- JaLC
- Crossref
- CiNii Articles
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- 抄録ライセンスフラグ
- 使用不可
