Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
SUZUKI Toshimasa and WAKABAYASHI Hirotaka and NISHI Yuji and FUJIMOTO Masayuki,Transmission Electron Microscopy Study of Defect Structure in Epitaxial SnO2 Rutile Thin Film.,Journal of the Ceramic Society of Japan,09145400,The Ceramic Society of Japan,2002,110,1278,86-91,https://cir.nii.ac.jp/crid/1390282680225903360,https://doi.org/10.2109/jcersj.110.86