Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
MASUDA Akihiko,Present and Future of Standardization of JIS Z 8115 Dependability Terms,IEICE ESS Fundamentals Review,1882-0875,"The Institute of Electronics, Information and Communication Engineers",2016,9,4,318-329,https://cir.nii.ac.jp/crid/1390282680319312256,https://doi.org/10.1587/essfr.9.4_318