Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Watanabe Jun and Miyazaki Makoto and Hatsuzawa Kenji and Shohji Ikuo,Influence of flux residue on reliability for underfill encapsulant,Proceedings of JIEP Annual Meeting,,The Japan Institute of Electronics Packaging,2010,24,0,316-317,https://cir.nii.ac.jp/crid/1390282680532868352,https://doi.org/10.11486/ejisso.24.0_316