Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Nishinomiya Suguru and Kubota Naoyoshi and Hayashi Syun-ichi and Takenaka Hisataka,Depth profiling of multilayered Si/Ti by resonant multi-photon ionization SNMS,Abstract of annual meeting of the Surface Science of Japan,,The Japan Society of Vacuum and Surface Science,2009,29,0,49-49,https://cir.nii.ac.jp/crid/1390282680656777344,https://doi.org/10.14886/sssj2008.29.0.49.0