Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
RI Shien and MURAMATSU Takashi and SAKA Masumi and TANAKA Hiroyuki and OKABE Yukihiro and SUZUKI Hiroshi,OS20F050 Accurate Measurement of Temperature-Dependent Warpage of Electronic Packaging Using FLCOS-based Fringe Projection Profilometry,The Abstracts of ATEM : International Conference on Advanced Technology in Experimental Mechanics : Asian Conference on Experimental Mechanics,2424-2837,The Japan Society of Mechanical Engineers,2011,2011.10,0,_OS20F050-,https://cir.nii.ac.jp/crid/1390282680849874688,https://doi.org/10.1299/jsmeatem.2011.10._os20f050-