{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1390282681224476032.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.1143/jjap.37.2734"}},{"identifier":{"@type":"COI","@value":"1:CAS:528:DyaK1cXjslWqurY%3D"}},{"identifier":{"@type":"NDL_BIB_ID","@value":"4493422"}},{"identifier":{"@type":"URI","@value":"http://id.ndl.go.jp/bib/4493422"}},{"identifier":{"@type":"URI","@value":"https://ndlsearch.ndl.go.jp/books/R000000004-I4493422"}},{"identifier":{"@type":"URI","@value":"https://iopscience.iop.org/article/10.1143/JJAP.37.2734"}},{"identifier":{"@type":"URI","@value":"https://iopscience.iop.org/article/10.1143/JJAP.37.2734/pdf"}},{"identifier":{"@type":"NAID","@value":"10004519113"}},{"identifier":{"@type":"NAID","@value":"130004524998"}},{"identifier":{"@type":"NAID","@value":"210000043135"}}],"dc:title":[{"@language":"en","@value":"Where Are the X-Ray Event Grades Formed Inside the Pixel of the Charge-Coupled Device? The Behavior of the Primary Charge Cloud Inside the Charge-Coupled Device."},{"@language":"ja-Kana","@value":"Where Are the X-Ray Event Grades Formed"}],"dc:language":"en","description":[{"type":"abstract","notation":[{"@language":"en","@value":"We report the use of an improved technique to measure the X-ray detection efficiency of a charge-coupled device (CCD) with a subpixel resolution. This technique makes use of a parallel X-ray beam and metal mesh placed closely on the CCD. The mesh has many circular holes spaced at distance of 4 times the CCD pixel size (multi-pitch mesh). We could identify the interaction position of X-rays both for single events and for split pixel events. By using this method, we demonstrated how various types of X-ray events are formed inside the CCD. We have already shown that the two-pixel split events were formed near the pixel boundary. We clearly showed that the three-pixel events were formed when the interaction position was close to the pixel corner, whereas the four-pixel split events were formed when the interaction position was much closer to the pixel corner. We found that the center of gravity of split events could represent the interaction position with an uncertainty of 0.13 pixel size."}],"abstractLicenseFlag":"disallow"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1410282681224476035","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000258141646"},{"@type":"NRID","@value":"9000401672162"},{"@type":"NRID","@value":"9000107374259"}],"foaf:name":[{"@language":"en","@value":"Tsunemi Hiroshi"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Department of Earth and Space Science, Graduate School of Science, Osaka University, Toyonaka 560–0043, Japan"},{"@language":"en","@value":"CREST, Japan Science and Technology Corporation (JST), Kawaguchi 332–0012, Japan"}]},{"@id":"https://cir.nii.ac.jp/crid/1410282681224476032","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000258141648"},{"@type":"NRID","@value":"9000401672164"},{"@type":"NRID","@value":"9000107374261"}],"foaf:name":[{"@language":"en","@value":"Yoshita Kumi"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Department of Earth and Space Science, Graduate School of Science, Osaka University, Toyonaka 560–0043, Japan"},{"@language":"en","@value":"CREST, Japan Science and Technology Corporation (JST), Kawaguchi 332–0012, Japan"}]},{"@id":"https://cir.nii.ac.jp/crid/1410282681224476033","@type":"Researcher","personIdentifier":[{"@type":"NRID","@value":"9000258141647"},{"@type":"NRID","@value":"9000401672163"},{"@type":"NRID","@value":"9000107374260"}],"foaf:name":[{"@language":"en","@value":"Hiraga Junko"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Department of Earth and Space Science, Graduate School of Science, Osaka University, Toyonaka 560–0043, Japan"},{"@language":"en","@value":"CREST, Japan Science and Technology Corporation (JST), Kawaguchi 332–0012, Japan"}]},{"@id":"https://cir.nii.ac.jp/crid/1420001326234564608","@type":"Researcher","personIdentifier":[{"@type":"KAKEN_RESEARCHERS","@value":"70177872"},{"@type":"NRID","@value":"1000070177872"},{"@type":"NRID","@value":"9000018294451"},{"@type":"NRID","@value":"9000277499570"},{"@type":"NRID","@value":"9000401950537"},{"@type":"NRID","@value":"9000387423343"},{"@type":"NRID","@value":"9000010161566"},{"@type":"NRID","@value":"9000237912910"},{"@type":"NRID","@value":"9000264240115"},{"@type":"NRID","@value":"9000018315143"},{"@type":"NRID","@value":"9000242854824"},{"@type":"NRID","@value":"9000256111574"},{"@type":"NRID","@value":"9000312827587"},{"@type":"NRID","@value":"9000324978027"},{"@type":"NRID","@value":"9000237913263"},{"@type":"NRID","@value":"9000401948691"},{"@type":"NRID","@value":"9000003446730"},{"@type":"NRID","@value":"9000258141649"},{"@type":"NRID","@value":"9000238235611"},{"@type":"NRID","@value":"9000242831816"},{"@type":"NRID","@value":"9000401663900"},{"@type":"NRID","@value":"9000401948640"},{"@type":"NRID","@value":"9000019186606"},{"@type":"NRID","@value":"9000241946243"},{"@type":"NRID","@value":"9000345349406"},{"@type":"NRID","@value":"9000401950193"},{"@type":"NRID","@value":"9000019186575"},{"@type":"NRID","@value":"9000408819999"},{"@type":"NRID","@value":"9000408820023"},{"@type":"NRID","@value":"9000408820057"},{"@type":"NRID","@value":"9000408820037"},{"@type":"NRID","@value":"9000291608653"},{"@type":"NRID","@value":"9000107374262"},{"@type":"NRID","@value":"9000023079403"},{"@type":"NRID","@value":"9000253690785"},{"@type":"RESEARCHMAP","@value":"https://researchmap.jp/read0090235"}],"foaf:name":[{"@language":"en","@value":"Kitamoto Shunji"}],"jpcoar:affiliationName":[{"@language":"en","@value":"Department of Earth and Space Science, Graduate School of Science, Osaka University, Toyonaka 560–0043, Japan"},{"@language":"en","@value":"CREST, Japan Science and Technology Corporation (JST), Kawaguchi 332–0012, Japan"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"00214922"},{"@type":"EISSN","@value":"13474065"},{"@type":"NDL_BIB_ID","@value":"000000159719"},{"@type":"ISSN","@value":"00214922"},{"@type":"LISSN","@value":"00214922"},{"@type":"PISSN","@value":"http://id.crossref.org/issn/13474065"},{"@type":"NCID","@value":"AA10457675"}],"prism:publicationName":[{"@language":"en","@value":"Japanese Journal of Applied Physics"},{"@language":"en","@value":"JPN. J. APPL. PHYS."},{"@language":"en","@value":"JJAP"}],"dc:publisher":[{"@language":"en","@value":"The Japan Society of Applied Physics"}],"prism:publicationDate":"1998","prism:volume":"37","prism:number":"5A","prism:startingPage":"2734","prism:endingPage":"2739"},"reviewed":"false","url":[{"@id":"http://id.ndl.go.jp/bib/4493422"},{"@id":"https://ndlsearch.ndl.go.jp/books/R000000004-I4493422"},{"@id":"https://iopscience.iop.org/article/10.1143/JJAP.37.2734"},{"@id":"https://iopscience.iop.org/article/10.1143/JJAP.37.2734/pdf"}],"availableAt":"1998","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=charge-coupled%20device","dc:title":"charge-coupled device"},{"@id":"https://cir.nii.ac.jp/all?q=X-ray%20event","dc:title":"X-ray event"},{"@id":"https://cir.nii.ac.jp/all?q=split%20event","dc:title":"split event"},{"@id":"https://cir.nii.ac.jp/all?q=subpixel%20resolution","dc:title":"subpixel resolution"}],"relatedProduct":[{"@id":"https://cir.nii.ac.jp/crid/1360016867162659584","@type":"Article","relationType":["references"],"jpcoar:relatedTitle":[{"@value":"<title>Structure measurement of the CCD pixel using an x-ray beam</title>"}]},{"@id":"https://cir.nii.ac.jp/crid/1360576200011970816","@type":"Article","relationType":["references"],"jpcoar:relatedTitle":[{"@value":"X-ray Detectors in Astronomy"}]},{"@id":"https://cir.nii.ac.jp/crid/1361694369232901760","@type":"Article","resourceType":"学術雑誌論文(journal article)","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@value":"Subpixel response of SOI pixel sensor for X-ray astronomy with pinned depleted diode: first result from mesh experiment"}]},{"@id":"https://cir.nii.ac.jp/crid/1363670319824688128","@type":"Article","relationType":["references"],"jpcoar:relatedTitle":[{"@value":"CCD Advances For X-Ray Scientific Measurements In 1985"}]},{"@id":"https://cir.nii.ac.jp/crid/1364233270527005440","@type":"Article","relationType":["references"],"jpcoar:relatedTitle":[{"@value":"CCD soft X-ray imaging spectrometer for the ASCA satellite"}]},{"@id":"https://cir.nii.ac.jp/crid/1390001206249995776","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"How Big Are Charge Clouds inside the Charge-Coupled Device Produced by X-Ray Photons?"},{"@language":"ja-Kana","@value":"How Big Are Charge Clouds inside the Ch"}]},{"@id":"https://cir.nii.ac.jp/crid/1390001206251302144","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Does an X-Ray Photon Really Generate a Charge Cloud with an Asymmetric Shape?"}]},{"@id":"https://cir.nii.ac.jp/crid/1390001206252910208","@type":"Article","relationType":["isReferencedBy"],"jpcoar:relatedTitle":[{"@language":"en","@value":"Subpixel Spatial Resolution of the X-Ray Charge-Coupled Device Based on the Charge Cloud Shape."}]},{"@id":"https://cir.nii.ac.jp/crid/1390282681226186752","@type":"Article","relationType":["references"],"jpcoar:relatedTitle":[{"@language":"en","@value":"New Technique of the X-Ray Efficiency Measurement of a Charge-Coupled Device with a Subpixel Resolution."},{"@language":"ja-Kana","@value":"New Technique of the X-Ray Efficiency M"}]},{"@id":"https://cir.nii.ac.jp/crid/1570009749304513920","@type":"Article","relationType":["cites"]},{"@id":"https://cir.nii.ac.jp/crid/1570291224297672960","@type":"Article","relationType":["cites"]},{"@id":"https://cir.nii.ac.jp/crid/1571417124188066432","@type":"Article","relationType":["cites"]},{"@id":"https://cir.nii.ac.jp/crid/1573105974034441984","@type":"Article","relationType":["cites"]},{"@id":"https://cir.nii.ac.jp/crid/1573668923987865216","@type":"Article","relationType":["cites"]},{"@id":"https://cir.nii.ac.jp/crid/1573950398964577536","@type":"Article","relationType":["cites"]},{"@id":"https://cir.nii.ac.jp/crid/1574231873874012288","@type":"Article","relationType":["cites"]}],"dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:0005381081"},{"@type":"NDL_SEARCH","@value":"oai:ndlsearch.ndl.go.jp:R000000004-I4493422"},{"@type":"CROSSREF","@value":"10.1143/jjap.37.2734"},{"@type":"CIA","@value":"130004524998"},{"@type":"CIA","@value":"210000043135"},{"@type":"CIA","@value":"10004519113"},{"@type":"OPENAIRE","@value":"doi_dedup___::b7d2f435c84e391ada1330b25ccdd6e9"},{"@type":"CROSSREF","@value":"10.1143/jjap.38.2953_references_DOI_Mhf3y9uNzhSM5v71FHQz1vuvgJv"},{"@type":"CROSSREF","@value":"10.1143/jjap.37.4627_references_DOI_Mhf3y9uNzhSM5v71FHQz1vuvgJv"},{"@type":"CROSSREF","@value":"10.1143/jjap.40.1493_references_DOI_Mhf3y9uNzhSM5v71FHQz1vuvgJv"},{"@type":"CROSSREF","@value":"10.1088/1748-0221/14/06/c06005_references_DOI_Mhf3y9uNzhSM5v71FHQz1vuvgJv"}]}