著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Toyota Yoshitaka and Tsuji Hiroshi and Gotoh Yasuhito and Ishikawa Junzo,Yield Measurement of Secondary Electrons Emitted from Silicon Dioxide Film in Negative-Ion Bombardment.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,1996,35,9A,4785-4788,https://cir.nii.ac.jp/crid/1390282681226819584,https://doi.org/10.1143/jjap.35.4785