Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Sano Nobuyuki and Matsuzawa Kazuya and Mukai Mikio and Nakayama Noriaki,Influence of Thermal Noise on Drain Current in Very Small Si-MOSFETs.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2000,39,4B,1974-1978,https://cir.nii.ac.jp/crid/1390282681227883392,https://doi.org/10.1143/jjap.39.1974