著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Matsumura Mieko and Hirose Yutaka,Extraction of the Capacitance of a Metal Oxide Semiconductor Tunnel Diode(MOSTD) Biased in Accumulation.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,1999,38,8A,L845-L847,https://cir.nii.ac.jp/crid/1390282681228030976,https://doi.org/10.1143/jjap.38.l845