著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kageshima Masami and Ogiso Hisato and Nakano Shizuka and Lantz Mark A. and Tokumoto Hiroshi,Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection.,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,1999,38,6B,3958-3961,https://cir.nii.ac.jp/crid/1390282681228163200,https://doi.org/10.1143/jjap.38.3958