著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Ohmori Kenji and Goto Tomokazu and Ikeda Hiroya and Sakai Akira and Zaima Shigeaki and Yasuda Yukio,Microscopic Observation of X-Ray Irradiation Damage in Ultra-Thin SiO<sub>2</sub> Films,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2001,40,4B,2823-2826,https://cir.nii.ac.jp/crid/1390282681233820800,https://doi.org/10.1143/jjap.40.2823