著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Choi Woo Young and Woo Dong-Soo and Choi Byung Yong and Lee Jong Duk and Park Byung-Gook,"Stable Extraction of Threshold Voltage Using Transconductance Change Method for CMOS Modeling, Simulation and Characterization",Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2004,43,4B,1759-1762,https://cir.nii.ac.jp/crid/1390282681240256384,https://doi.org/10.1143/jjap.43.1759