著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Tajima Michio and Li Zhiqiang and Sumie Shingo and Hashizume Hidehisa and Ogura Atsushi,Comparison of Silicon-on-Insulator Wafer Mappings between Photoluminescence Intensity and Microwave Photoconductivity Decay Lifetime,Japanese Journal of Applied Physics,00214922,The Japan Society of Applied Physics,2004,43,2,432-438,https://cir.nii.ac.jp/crid/1390282681241700096,https://doi.org/10.1143/jjap.43.432