著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Kawado Seiji and Hayafuji Yoshinori and Adachi Tohru,Observation of Lattice Defects in Silicon by Scanning Electron Microscopy Utilizing Beam Induced Current Generated in Schottky Barriers,Japanese Journal of Applied Physics,0021-4922,The Japan Society of Applied Physics,1975,14,3,407-408,https://cir.nii.ac.jp/crid/1390282681244982912,https://doi.org/10.1143/jjap.14.407