著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
YAMASHITA Jun and YOTSUYANAGI Hiroyuki and HASHIZUME Masaki and KINOSHITA Kozo,SAT-Based Test Generation for Open Faults Using Fault Excitation Caused by Effect of Adjacent Lines,"IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences",09168508,一般社団法人 電子情報通信学会,2013,E96.A,12,2561-2567,https://cir.nii.ac.jp/crid/1390282681288947840,https://doi.org/10.1587/transfun.e96.a.2561