著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
Urushihara N. and Sanada N. and Paul D. and Suzuki M.,Ion Beam Alignment Procedures using a Faraday Cup or a Silicon Dioxide Film on Silicon Substrate with Auger Electron Microscope,Journal of Surface Analysis,13411756,一般社団法人 表面分析研究会,2007,14,2,124-130,https://cir.nii.ac.jp/crid/1390282763059813504,https://doi.org/10.1384/jsa.14.124