Improvement of Sampling Inspection for Wire Bonding Using Thin AE Sensor and Transfer Learning
Bibliographic Information
- Other Title
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- 薄型AEセンサと転移学習を用いたワイヤボンディング抜取検査の性能向上
Journal
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- Proceedings of JIEP Annual Meeting
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Proceedings of JIEP Annual Meeting 32 (0), 211-213, 2018
The Japan Institute of Electronics Packaging
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Details
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- CRID
- 1390282763119234560
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- NII Article ID
- 130007627630
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- Text Lang
- ja
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- Data Source
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- JaLC
- CiNii Articles