著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
LI JIAPENG and Lu Lei and Xia Zhihe and Wang Sisi and Zhou Zhichao and Shi Runxiao and Kwok Hoi-Sing and Wong Man,Effect of Ambient Atmosphere on Abnormal Degradation Behavior in Metal-Oxide Thin-Film Transistor under Positive Gate-Bias and Temperature Stress,Proceedings of the International Display Workshops,1883-2490,一般社団法人ディスプレイ国際ワークショップ,2019-11-28,,,551,https://cir.nii.ac.jp/crid/1390283659853592064,https://doi.org/10.36463/idw.2019.amdp1-17