{"@context":{"@vocab":"https://cir.nii.ac.jp/schema/1.0/","rdfs":"http://www.w3.org/2000/01/rdf-schema#","dc":"http://purl.org/dc/elements/1.1/","dcterms":"http://purl.org/dc/terms/","foaf":"http://xmlns.com/foaf/0.1/","prism":"http://prismstandard.org/namespaces/basic/2.0/","cinii":"http://ci.nii.ac.jp/ns/1.0/","datacite":"https://schema.datacite.org/meta/kernel-4/","ndl":"http://ndl.go.jp/dcndl/terms/","jpcoar":"https://github.com/JPCOAR/schema/blob/master/2.0/"},"@id":"https://cir.nii.ac.jp/crid/1390283659853592064.json","@type":"Article","productIdentifier":[{"identifier":{"@type":"DOI","@value":"10.36463/idw.2019.amdp1-17"}}],"dc:title":[{"@language":"en","@value":"Effect of Ambient Atmosphere on Abnormal Degradation Behavior in Metal-Oxide Thin-Film Transistor under Positive Gate-Bias and Temperature Stress"}],"creator":[{"@id":"https://cir.nii.ac.jp/crid/1410283659853592192","@type":"Researcher","foaf:name":[{"@language":"en","@value":"LI JIAPENG"}]},{"@id":"https://cir.nii.ac.jp/crid/1410283659853592064","@type":"Researcher","foaf:name":[{"@language":"en","@value":"Lu Lei"}]},{"@id":"https://cir.nii.ac.jp/crid/1410283659853592196","@type":"Researcher","foaf:name":[{"@language":"en","@value":"Xia Zhihe"}]},{"@id":"https://cir.nii.ac.jp/crid/1410283659853592194","@type":"Researcher","foaf:name":[{"@language":"en","@value":"Wang Sisi"}]},{"@id":"https://cir.nii.ac.jp/crid/1410283659853592195","@type":"Researcher","foaf:name":[{"@language":"en","@value":"Zhou Zhichao"}]},{"@id":"https://cir.nii.ac.jp/crid/1410283659853592197","@type":"Researcher","foaf:name":[{"@language":"en","@value":"Shi Runxiao"}]},{"@id":"https://cir.nii.ac.jp/crid/1410283659853592193","@type":"Researcher","foaf:name":[{"@language":"en","@value":"Kwok Hoi-Sing"}]},{"@id":"https://cir.nii.ac.jp/crid/1410283659853592198","@type":"Researcher","foaf:name":[{"@language":"en","@value":"Wong Man"}]}],"publication":{"publicationIdentifier":[{"@type":"PISSN","@value":"18832490"}],"prism:publicationName":[{"@language":"en","@value":"Proceedings of the International Display Workshops"}],"dc:publisher":[{"@language":"en","@value":"International Display Workshops General Incorporated Association"},{"@language":"ja","@value":"一般社団法人ディスプレイ国際ワークショップ"}],"prism:publicationDate":"2019-11-28","prism:startingPage":"551"},"reviewed":"false","availableAt":"2019-11-28","foaf:topic":[{"@id":"https://cir.nii.ac.jp/all?q=General%20Medicine","dc:title":"General Medicine"}],"dataSourceIdentifier":[{"@type":"JALC","@value":"oai:japanlinkcenter.org:2007650260"},{"@type":"CROSSREF","@value":"10.36463/idw.2019.amdp1-17"}]}