Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Kawashima Shun and Ke Mengnan and Kawahara Takayuki,TCAD simulation of BTI characteristics influenced by Oxygen Vacancies in Al2O3/GeO2/Ge pMOSFET,JSAP Annual Meetings Extended Abstracts,2436-7613,The Japan Society of Applied Physics,2020-08-26,2020.2,0,1747-1747,https://cir.nii.ac.jp/crid/1390291932617843072,https://doi.org/10.11470/jsapmeeting.2020.2.0_1747