Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Matsuda Shinpei and Takeuchi Ken,A Numerical Model of ReRAM Reliability based on Lattice Random Walk,JSAP Annual Meetings Extended Abstracts,2436-7613,The Japan Society of Applied Physics,2019-02-25,2019.1,0,2783-2783,https://cir.nii.ac.jp/crid/1390293202185797504,https://doi.org/10.11470/jsapmeeting.2019.1.0_2783