Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Kobayashi Hiroto and Yokogawa Ryo and Suzuki Takahiro and Numazawa Yoichiro and Ogura Atsushi and Nishizawa Shin-ichi and Saraya Takuya and Ito Kazuo and Takakura Toshihiko and Suzuki Shin-ichi and Fukui Munetoshi and Takeuchi Kiyoshi and Hiramoto Toshiro,Evaluation of Minority Carrier Lifetime in FZ-Si Affected by Si-IGBT Process,JSAP Annual Meetings Extended Abstracts,2436-7613,The Japan Society of Applied Physics,2018-03-05,2018.1,0,3140-3140,https://cir.nii.ac.jp/crid/1390293655509071872,https://doi.org/10.11470/jsapmeeting.2018.1.0_3140