Author,Title,Journal,ISSN,Publisher,Date,Volume,Number,Page,URL,URL(DOI)
Terao Takahiro and Uchida Teruhisa and Ishii Hidetoki and Hayashi Atsuhiro and Nakamura Hiroyuki and Tatewaki Yosuke and Nishigori Dai and Miyamoto Tomohiro and Kubo Saori and Kuramoto Naoki,Our experience of crises in the recent university entrance examinations,Japanese Journal for Research on Testing,1880-9618,The Japan Association for Research on Testing,2024,20,1,43-71,https://cir.nii.ac.jp/crid/1390300679200374272,https://doi.org/10.24690/jart.20.1_43