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Inlight Optically Stimulated Luminescence for Occupational Monitoring Service in Thailand.
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- SUDCHAI Waraporn
- Department of Medical Sciences, Thailand
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- SA-NGAN-SAT Attakovit
- Department of Medical Sciences, Thailand
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Description
In Thailand, Personal Radiation Monitoring Service is responsible of Department of Medical Sciences (DMSc), Ministry of Public Health, which served the personal dosimeters for nearly 30,000 radiation workers, medical industrial and research, by using TLD and OSL technology. Inlight Optically Stimulated Luminescence (OSL) technology, the modern in passive radiation protection dosimetry, is selected to replace the old film badge system in 2009. Radiation exposure is measured by stimulating the detector, aluminum oxide (Al2O3 : C) crystal, with a green Light Emitting Diode (LED) array causing the luminescent phenomena which proportion to the amount of radiation absorbed. During the stimulation only some trapped electrons are released so the dosimeters can be re-read. The dosimeters are reported to have a high sensitivity and dose can be accumulated from 10 µSv (1mrem) to 10 Sv (1,000 rem). For photon and beta monitoring conventional Inlight OSL dosimeters are used but for neutron monitoring Inlight OSLN dosimeters are used. Dose algorithm for dose reporting in term of Hp(10), Hp(0.07) and Hp(3) were accredited by NAVLAP, the accreditation body in the United State. In this study, neutron dose validation was performed by comparison method. OSLN cards were sent to irradiate with standard neutron sources at the PTB in Germany. The percentage difference between calculated dose and delivered dose were found to be 6.5 % for Cf-252 neutron source and 1% - 37 % for Am-Be neutron source respectively. For Cf-252 neutron monitoring, built-in correction factor will be used while for Am-Be neutron monitoring calibration graph from this study will be used. By the year 2011, all of the service will be switched to OSL system.
Journal
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- Progress in Nuclear Science and Technology
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Progress in Nuclear Science and Technology 3 94-96, 2012
Atomic Energy Society of Japan