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名古屋大学タンデトロン2号機の現状(第16回名古屋大学タンデトロン加速器質量分析計シンポジウム平成15(2003)年度報告)

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  • Status on Tandetron II in Nagoya University(Proceedings of the 16^<th> Symposium on Researches Using the Tandetron AMS System at Nagoya University in 2003)

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Abstract

TANDETRON II (Model-4130 AMS, HVEE) in Nagoya University is an accelerator mass spectrometer for the ^<14>C dating. Getting over numbers of trouble, the performance test was done in January 1999. However, we could not place it straightway at the regular service, suffering from successive big troubles happened after that test. We restarted the measurement from the beginning of November 1999. After the checking of total systems by HVEE engineer in September 2000 and we applied ourselves to the routine measurement whose procedure was established in 2000. The operation status in 2003 is shown in Fig.1 and Fig.2. The number of targets measured in 2003 was 1979 targets/year or 165 targets/month. In our routine procedure, it takes one week to measure 45 targets (32 samples and 13 standards). Total measurement time was 3219 hours/year and 268 hours/month in that period. The yearly changes in these 5 years are shown in Fig.3. The capability of the water cooling system for magnets and pumps was declining gradually. It could not keep the low temperature of the water especially for the daytime in hot summer. We tried to improve circumference environment by sprinkling water. Finally it could not keep the power even in cold winter term. We replaced it with new better one at the end of January 2004. It is since 8 years from the installation of the machine, or 6 years from the starting of its practical service. Hereafter, we should be careful to the deterioration or the aging of each part, to hold the machine ever in good condition. More careful and foreseeing measures of maintenance should be devised to avoid any destructive trouble. We aim to measure steadily target-by-target as carefully as possible to fit the condition of each sample, rather than forcing to increase a number of measured targets.

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