著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
SANDOVAL Jaime and UENISHI Kazuma and IWAKIRI Munetoshi and TANAKA Kiyoshi,Robust 3D Planes Detection under Noisy Conditions Using Scaled Difference of Normals,IIEEJ Transactions on Image Electronics and Visual Computing,2188-1898,一般社団法人 画像電子学会,2017-12-15,5,2,60-73,https://cir.nii.ac.jp/crid/1390845712976169728,https://doi.org/10.11371/tievciieej.5.2_60