著者名,論文名,雑誌名,ISSN,出版者名,出版日付,巻,号,ページ,URL,URL(DOI)
ASHIKIN Fara and HASHIZUME Masaki and YOTSUYANAGI Hiroyuki and LU Shyue-Kung and ROTH Zvi,A Design for Testability of Open Defects at Interconnects in 3D Stacked ICs,IEICE Transactions on Information and Systems,0916-8532,一般社団法人 電子情報通信学会,2018-08-01,E101.D,8,2053-2063,https://cir.nii.ac.jp/crid/1390845712979360256,https://doi.org/10.1587/transinf.2018edp7093